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Aerospace Nuclear Science & Technology
Organized to promote the advancement of knowledge in the use of nuclear science and technologies in the aerospace application. Specialized nuclear-based technologies and applications are needed to advance the state-of-the-art in aerospace design, engineering and operations to explore planetary bodies in our solar system and beyond, plus enhance the safety of air travel, especially high speed air travel. Areas of interest will include but are not limited to the creation of nuclear-based power and propulsion systems, multifunctional materials to protect humans and electronic components from atmospheric, space, and nuclear power system radiation, human factor strategies for the safety and reliable operation of nuclear power and propulsion plants by non-specialized personnel and more.
Meeting Spotlight
2024 ANS Winter Conference and Expo
November 17–21, 2024
Orlando, FL|Renaissance Orlando at SeaWorld
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Latest News
From remediation to production: The DOE’s Cleanup to Clean Energy initiative
On July 28, 2023, the Department of Energy launched its Cleanup to Clean Energy initiative, an effort to repurpose underutilized DOE-owned property—portions of which were previously used in the nation’s nuclear weapons program—into the sites of clean-energy generation.
M. L. Dunzik-Gougar, I. J. van Rooyen, C. M. Hill, T. Trowbridge, J. Madden, J. Burns
Nuclear Technology | Volume 196 | Number 1 | October 2016 | Pages 111-120
Technical Paper | doi.org/10.13182/NT15-129
Articles are hosted by Taylor and Francis Online.
Crystallographic information about layers of silicon carbide (SiC) deposited by chemical vapor deposition is essential to understanding layer performance, especially when the the layers are in nonplanar geometries (e.g., spherical). Electron backscatter diffraction (EBSD) was used to analyze spherical SiC layers using a different sampling approach that applied focused ion beam (FIB) milling to avoid the negative impacts of traditional sample polishing and address the need for very small samples of irradiated materials for analysis. The mechanical and chemical grinding and polishing of sample surfaces can introduce lattice strain and result in the unequal removal of SiC and the surrounding layers of different materials due to the hardness differences among these materials. The nature of layer interfaces is thought to play a key role in the performance of SiC; therefore, the analysis of representative samples at these interfacial areas is crucial. In the work reported herein, a FIB was employed in a novel manner to prepare a more representative sample for EBSD analysis from tristructural-isotropic layers that are free of effects introduced by mechanical and chemical preparation methods. In addition, the difficulty of handling neutron-irradiated microscopic samples (such as those analyzed in this work) has been simplified using pretilted mounting stages. The results showed that while the average grain sizes of samples may be similar, the grain boundary characteristics can differ significantly. Furthermore, low-angle grain boundaries comprised 25% of all boundaries in the FIB-prepared sample compared to only 1% to 2% in the polished sample from the same particle. This study demonstrated that the characterization results from FIB-prepared samples provide more repeatable results due to the elimination of the effects of sample preparation.