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Nuclear Criticality Safety
NCSD provides communication among nuclear criticality safety professionals through the development of standards, the evolution of training methods and materials, the presentation of technical data and procedures, and the creation of specialty publications. In these ways, the division furthers the exchange of technical information on nuclear criticality safety with the ultimate goal of promoting the safe handling of fissionable materials outside reactors.
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2024 ANS Annual Conference
June 16–19, 2024
Las Vegas, NV|Mandalay Bay Resort and Casino
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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The Nuclear Family: Empowering parents and caregivers
The Diversity and Inclusion in ANS Committee is hosting a webinar today to celebrate the contributions of parents in the nuclear industry while fostering diversity and inclusion within the community.
Register now: The webinar, from 1:00-2:00 pm ET, will highlight how the nuclear industry supports caregivers, new parents, and new mothers, and will focus on life transitions and parental responsibilities.
Nikolaus Christiansen, Derek Schmidt, John Martinez, Valerie Fatherley, Justin Jorgenson, Noah Birge, Verena Geppert-Kleinrath, Carl Wilde
Fusion Science and Technology | Volume 79 | Number 7 | October 2023 | Pages 907-913
Research Article | doi.org/10.1080/15361055.2023.2210298
Articles are hosted by Taylor and Francis Online.
The neutron pinhole array, used to collect neutron burn, X-ray, and more recently, gamma emission images, has been in use at the National Ignition Facility since 2011. Since then, there has been the ever-continuing challenge of meeting tighter alignment and resolution requirements. Part of that challenge is being able to accurately characterize the as-built variances from the nominal design associated with the manufacturing and assembly of the pinhole array. To overcome this specific challenge, multiple processes are taken to obtain high-precision profiles of the various features of each pinhole array. This paper highlights the processes used as well as the steps taken to compile the significant amount of data and turn it into an accurate as-built reconstructed model of the NIS1-U–assembled pinhole array.