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2025 ANS Winter Conference & Expo
November 9–12, 2025
Washington, DC|Washington Hilton
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The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Latest News
PR: American Nuclear Society welcomes Senate confirmation of Ted Garrish as the DOE’s nuclear energy secretary
Washington, D.C. — The American Nuclear Society (ANS) applauds the U.S. Senate's confirmation of Theodore “Ted” Garrish as Assistant Secretary for Nuclear Energy at the U.S. Department of Energy (DOE).
“On behalf of over 11,000 professionals in the fields of nuclear science and technology, the American Nuclear Society congratulates Mr. Garrish on being confirmed by the Senate to once again lead the DOE Office of Nuclear Energy,” said ANS President H.M. "Hash" Hashemian.
H. Huang, S. A. Eddinger, R. B. Stephens, A. Nikroo
Fusion Science and Technology | Volume 55 | Number 4 | May 2009 | Pages 380-388
Technical Paper | Eighteenth Target Fabrication Specialists' Meeting | doi.org/10.13182/FST55-380
Articles are hosted by Taylor and Francis Online.
Rayleigh-Taylor instabilities are caused by features that affect shock velocity. These features can be statistically measured by radiography. We designed a precision radiography (PR) system that measures X-ray opacity variations in National Ignition Facility (NIF) ablator capsules to 10-4. Quantitative interpretation of the PR data is challenging and is the subject of this paper. The PR opacity power spectrum (PS) must be related to the NIF surface PS requirements (commonly known as the "NIF curves"). This relationship must be calculated for each specific shell. The compounding factors include X-ray spectra and spot size, detector resolution, shell diameter, coating thickness, dopant and impurity levels, and the coherency status of interface roughness between different layers. In this work, we developed a useful tool to quickly compute the NIF opacity curve (more precisely referred to as NIF "OD [optical depth] PS reference curve" in this paper) for any partially coated NIF shells or nonstandard developmental shells. This allows more rapid feedback on the quality of shells using only partially coated shells and enables benchmarking between the opacity (measured by a radiographic instrument) and surface roughness (measured by an atomic force microscope).