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Going Nuclear: Notes from the officially unofficial book tour
I work in the analytical labs at one of Europe’s oldest and largest nuclear sites: Sellafield, in northwestern England. I spend my days at the fume hood front, pipette in one hand and radiation probe in the other (and dosimeter pinned to my chest, of course). Outside the lab, I have a second job: I moonlight as a writer and public speaker. My new popular science book—Going Nuclear: How the Atom Will Save the World—came out last summer, and it feels like my life has been running at full power ever since.
H. Huang, S. A. Eddinger, R. B. Stephens, A. Nikroo
Fusion Science and Technology | Volume 55 | Number 4 | May 2009 | Pages 380-388
Technical Paper | Eighteenth Target Fabrication Specialists' Meeting | doi.org/10.13182/FST55-380
Articles are hosted by Taylor and Francis Online.
Rayleigh-Taylor instabilities are caused by features that affect shock velocity. These features can be statistically measured by radiography. We designed a precision radiography (PR) system that measures X-ray opacity variations in National Ignition Facility (NIF) ablator capsules to 10-4. Quantitative interpretation of the PR data is challenging and is the subject of this paper. The PR opacity power spectrum (PS) must be related to the NIF surface PS requirements (commonly known as the "NIF curves"). This relationship must be calculated for each specific shell. The compounding factors include X-ray spectra and spot size, detector resolution, shell diameter, coating thickness, dopant and impurity levels, and the coherency status of interface roughness between different layers. In this work, we developed a useful tool to quickly compute the NIF opacity curve (more precisely referred to as NIF "OD [optical depth] PS reference curve" in this paper) for any partially coated NIF shells or nonstandard developmental shells. This allows more rapid feedback on the quality of shells using only partially coated shells and enables benchmarking between the opacity (measured by a radiographic instrument) and surface roughness (measured by an atomic force microscope).