ANS is committed to advancing, fostering, and promoting the development and application of nuclear sciences and technologies to benefit society.
Explore the many uses for nuclear science and its impact on energy, the environment, healthcare, food, and more.
Explore membership for yourself or for your organization.
Conference Spotlight
Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
Latest Magazine Issues
Jul 2025
Jan 2025
Latest Journal Issues
Nuclear Science and Engineering
September 2025
Nuclear Technology
August 2025
Fusion Science and Technology
Latest News
Remembering ANS member Gil Brown
Brown
The nuclear community is mourning the loss of Gilbert Brown, who passed away on July 11 at the age of 77 following a battle with cancer.
Brown, an American Nuclear Society Fellow and an ANS member for nearly 50 years, joined the faculty at Lowell Technological Institute—now the University of Massachusetts–Lowell—in 1973 and remained there for the rest of his career. He eventually became director of the UMass Lowell nuclear engineering program. After his retirement, he remained an emeritus professor at the university.
Sukesh Aghara, chair of the Nuclear Engineering Department Heads Organization, noted in an email to NEDHO members and others that “Gil was a relentless advocate for nuclear energy and a deeply respected member of our professional community. He was also a kind and generous friend—and one of the reasons I ended up at UMass Lowell. He served the university with great dedication. . . . Within NEDHO, Gil was a steady presence and served for many years as our treasurer. His contributions to nuclear engineering education and to this community will be dearly missed.”
M. L. Dunzik-Gougar, I. J. van Rooyen, C. M. Hill, T. Trowbridge, J. Madden, J. Burns
Nuclear Technology | Volume 196 | Number 1 | October 2016 | Pages 111-120
Technical Paper | doi.org/10.13182/NT15-129
Articles are hosted by Taylor and Francis Online.
Crystallographic information about layers of silicon carbide (SiC) deposited by chemical vapor deposition is essential to understanding layer performance, especially when the the layers are in nonplanar geometries (e.g., spherical). Electron backscatter diffraction (EBSD) was used to analyze spherical SiC layers using a different sampling approach that applied focused ion beam (FIB) milling to avoid the negative impacts of traditional sample polishing and address the need for very small samples of irradiated materials for analysis. The mechanical and chemical grinding and polishing of sample surfaces can introduce lattice strain and result in the unequal removal of SiC and the surrounding layers of different materials due to the hardness differences among these materials. The nature of layer interfaces is thought to play a key role in the performance of SiC; therefore, the analysis of representative samples at these interfacial areas is crucial. In the work reported herein, a FIB was employed in a novel manner to prepare a more representative sample for EBSD analysis from tristructural-isotropic layers that are free of effects introduced by mechanical and chemical preparation methods. In addition, the difficulty of handling neutron-irradiated microscopic samples (such as those analyzed in this work) has been simplified using pretilted mounting stages. The results showed that while the average grain sizes of samples may be similar, the grain boundary characteristics can differ significantly. Furthermore, low-angle grain boundaries comprised 25% of all boundaries in the FIB-prepared sample compared to only 1% to 2% in the polished sample from the same particle. This study demonstrated that the characterization results from FIB-prepared samples provide more repeatable results due to the elimination of the effects of sample preparation.