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Experimental Test of Double-Layer Method for Industrial SPECT

Jang Guen Park, Chan Hyeong Kim, Chul Hee Min, Jong Hwi Jeong, Jong Bum Kim, Jinho Moon, Sung-Hee Jung

Nuclear Technology / Volume 175 / Number 1 / July 2011 / Pages 113-117

Technical Paper / Special Issue on the 16th Biennial Topical Meeting of the Radiation Protection and Shielding Division / Radiation Measurements and General Instrumentation

In industrial-type single-photon-emission computed tomography (SPECT) systems, the use of relatively large detectors and collimators for effective detection of high-energy gammas significantly limits imaging performance, primarily because of insufficient measurement points. In the present study, a simple but very effective image-quality improvement method, the double-layer method, was tested. In this method, two layers of identical SPECT systems are employed in order to increase the number of measurement points and, thereby, improve the image quality. For experimentation, the two identical detector layers were arranged for 30 deg of rotation with respect to each other. The results showed that the double-layer method indeed significantly improves the image quality of the industrial SPECT system, substantially reducing errors in source size and location for both low-energy (99mTc) and high-energy (113mIn) gamma sources.

 
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