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Atlanta, GA|Atlanta Marriott Marquis
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Remembering ANS member Gil Brown
Brown
The nuclear community is mourning the loss of Gilbert Brown, who passed away on July 11 at the age of 77 following a battle with cancer.
Brown, an American Nuclear Society Fellow and an ANS member for nearly 50 years, joined the faculty at Lowell Technological Institute—now the University of Massachusetts–Lowell—in 1973 and remained there for the rest of his career. He eventually became director of the UMass Lowell nuclear engineering program. After his retirement, he remained an emeritus professor at the university.
Sukesh Aghara, chair of the Nuclear Engineering Department Heads Organization, noted in an email to NEDHO members and others that “Gil was a relentless advocate for nuclear energy and a deeply respected member of our professional community. He was also a kind and generous friend—and one of the reasons I ended up at UMass Lowell. He served the university with great dedication. . . . Within NEDHO, Gil was a steady presence and served for many years as our treasurer. His contributions to nuclear engineering education and to this community will be dearly missed.”
Arthur C. Miller, Jr., Joseph L. Cochran, Vincent E. Lamberti
Nuclear Science and Engineering | Volume 149 | Number 2 | February 2005 | Pages 115-123
Technical Paper | doi.org/10.13182/NSE05-A2482
Articles are hosted by Taylor and Francis Online.
High-energy film radiography methods, adapted in the past to performing specific tasks, must now meet increasing demands to identify defects and perform critical measurements in a wide variety of manufacturing processes. Although film provides unequaled resolution for most components and assemblies, image quality must be enhanced with much more detailed information to identify problems and qualify features of interest inside manufactured items. The work described is concerned with improving current 9-MeV nondestructive practice by optimizing the important parameters involved in film radiography using computational methods. To follow important scattering effects produced by electrons, the Monte Carlo N-Particle transport code was used with advanced, highly parallel computer systems. The work has provided a more detailed understanding of latent image formation at high X-ray energies, and suggests that improvements can be made in our ability to identify defects and to obtain much more detail in images of fine features.