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Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
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The RAIN scale: A good intention that falls short
Radiation protection specialists agree that clear communication of radiation risks remains a vexing challenge that cannot be solved solely by finding new ways to convey technical information.
Earlier this year, an article in Nuclear News described a new radiation risk communication tool, known as the Radiation Index, or, RAIN (“Let it RAIN: A new approach to radiation communication,” NN, Jan. 2025, p. 36). The authors of the article created the RAIN scale to improve radiation risk communication to the general public who are not well-versed in important aspects of radiation exposures, including radiation dose quantities, units, and values; associated health consequences; and the benefits derived from radiation exposures.
Felix C. Difilippo
Nuclear Science and Engineering | Volume 142 | Number 2 | October 2002 | Pages 140-149
Technical Paper | doi.org/10.13182/NSE02-A2294
Articles are hosted by Taylor and Francis Online.
The analysis of the fluctuations of signals coming from detectors in the vicinity of a subcritical assembly of fissile materials is commonly used for the control and safeguard of nuclear materials and might be used for the surveillance of an accelerator driven system. One of the stochastic techniques is the measurement of the probability distributions of counts in time intervals t (gates); the departure of the ratio of the variance and the mean value with respect to 1 (the correlation) is directly related to the amount of fissile material and its subcriticality. The measurement of this correlation is affected by dead-time effects due to count losses because of the finite-time resolution of the detection system. We present a theory that allows (a) the calculation of the probability of losing n counts (P(n)) in gate t, (b) the definition of experimental conditions under which P(2) << P(1), and (c) a methodology to correct the measured correlation because of losing one count in any gate. The theory is applied to the analysis of experiments performed in a highly enriched subcritical assembly.
