Nondestructive Investigations of a Copper- and Argon-Doped Sputtered Beryllium Capsule Using X-Rays in Three Dimensions

Three-dimensional (3-D) computed micro X-ray tomography (micro CT) and 3-D confocal micro X-ray fluorescence (MXRF) combined are very useful nondestructive metrology techniques for determining the unique compositional and morphological information of fusion targets and target materials. Micro CT and confocal MXRF are being used in concert to examine a beryllium ablator capsule that has been sputtered and graded doped with copper and argon. In this manuscript, we will show that two-dimensional (2-D) MXRF imaging in concert with a simple radiograph is very useful for approximating the copper and argon profiles in the x and y dimensions, but because of the lack of signal discrimination in the z direction, image "bleed" from the sample regions where the X-rays are out of focus is prevalent. Data collected using the micro CT and overlapped with the confocal MXRF data produce absorbance and elemental line profiles without the signal bleed. Overlapping the 3-D data from these techniques provides a more accurate picture of the composition of these capsules than 2-D nondestructive techniques.