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Increasing the Throughput of Phase-Shifting Diffraction Interferometer for Quantitative Characterization of ICF Ablator Capsule Surfaces

Y. T. Lee, A. Q. L. Nguyen, H. Huang, K. A. Moreno, K. C. Chen, C. Chen, M. A. Johnson, J. D. Hughes, R. C. Montesanti, D. W. Phillion

Fusion Science and Technology / Volume 55 / Number 4 / May 2009 / Pages 405-410

Technical Paper / Eighteenth Target Fabrication Specialists' Meeting /

A phase-shifting diffraction interferometer provides full surface mapping of National Ignition Facility (NIF) ablator capsules for surface finish and isolated defects. To integrate this new instrument into the NIF metrology work flow, the measurement must be both quick and accurate. In this work, we developed automated processing algorithms to streamline a large number of manual steps. This enables the process time to be reduced from 1½ days to 2 h per shell, thus meeting the NIF throughput requirement of 20 capsules/week. We also developed methods to quantitatively report the isolated defects and surface roughness in formats that can be benchmarked against the NIF specifications.

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