Applicability of microwave imaging reflectometry (MIR) for the case of mirror device was numerically studied. The questions concerning radial localization of measurements, optimal position of optical system and imaging properties of MIR system were considered. The high curvature of the plasma cutoff layer and a relatively small distance from the plasma to the port are known to improve the performance of a conventional reflectometer. Nevertheless in the case of density fluctuations with wide wavenumber spectrum and large amplitude, the imaging reflectrometry shows better results than the conventional one.