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Ultrashort-Pulse Reflectometry in the Gamma 10 Device

A. Itakura, T. Hirai, H. Hojo, J. Kohagura, Y. Shima, S. Tsunoda, M. Yoshikawa, K. Yatsu

Fusion Science and Technology / Volume 43 / Number 1T / January 2003 / Pages 243-247

Diagnostics / dx.doi.org/10.13182/FST03-A11963603

Published:February 8, 2018

An electron density profile is observed by using an ultrashort-pulse reflectometry in the central cell of the GAMMA 10 device. The pulse having 65 ps FWHM is launched into the plasma in the O-mode and reflected at the cut off layer. The frequency range of the receiving system is 6 to 11 GHz. Time of flight of the received signal is measured via a time to amplitude converter and processed by a computer. Here, electron density profile lower than 1.5 × 1018 m−3 is reconstructed within one-shot data. The time variation of the electron density profile is acquired. Reflected wave has information of fluctuation, simultaneously. Frequency spectrum of the fluctuation is also observed.

 
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