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Electron Density Measurements of a Thin Plasma Layer by Surface Plasmon Interferometry

H. Hojo, A. Mase (19P33)

Fusion Science and Technology / Volume 51 / Number 2T / February 2007 / Pages 304-306

Technical Paper / Open Magnetic Systems for Plasma Confinement /

We present a new method for measuring the electron density of a thin plasma layer. The method uses evanescent electromagnetic waves in plasma. We study the transmittance of transverse-magnetic electromagnetic waves incident obliquely to a thin plasma layer, and show that we can determine the electron density of the plasma layer from the measurement of the angle of wave incidence corresponding to the maximum transmittance.

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