Fusion Science and Technology / Volume 51 / Number 2T / February 2007 / Pages 304-306
Technical Paper / Open Magnetic Systems for Plasma Confinement / dx.doi.org/10.13182/FST07-A1383
We present a new method for measuring the electron density of a thin plasma layer. The method uses evanescent electromagnetic waves in plasma. We study the transmittance of transverse-magnetic electromagnetic waves incident obliquely to a thin plasma layer, and show that we can determine the electron density of the plasma layer from the measurement of the angle of wave incidence corresponding to the maximum transmittance.