Fusion Science and Technology / Volume 49 / Number 4 / May 2006 / Pages 635-637
Technical Paper / Target Fabrication / dx.doi.org/10.13182/FST06-A1177
White light interferometry has been adapted to the characterization of transparent and opaque witness plates for ICF and high energy physics experiments. An interferometric microscope, a precision z-stage, and a technique that minimizes optical dispersion allows determination of witness plate thickness to sub-micron precision. The hardware and methodology required for this measurement are described.