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Conference Spotlight
2025 ANS Winter Conference & Expo
November 8–12, 2025
Washington, DC|Washington Hilton
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The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Latest News
Nuclear News 40 Under 40: The wait is over
Following the enthusiastic response from the nuclear community in 2024 for the inaugural NN 40 Under 40, the Nuclear News team knew we had to take up the difficult task in 2025 of turning it into an annual event—though there was plenty of uncertainty as to how the community would receive a second iteration this year. That uncertainty was unfounded, clearly, as the tight-knit nuclear community embraced the chance to celebrate its up-and-coming generation of scientists, engineers, and policy makers who are working to grow the influence of this oft-misunderstood technology.
J. Sánchez, S. Dormido-Canto, J. Vega, N. Duro, R. Dormido, S. Dormido
Fusion Science and Technology | Volume 58 | Number 2 | October 2010 | Pages 666-674
Selected Paper from the Sixth Fusion Data Validation Workshop 2010 (Part 1) | doi.org/10.13182/FST10-A10891
Articles are hosted by Taylor and Francis Online.
This paper presents a first attempt to use event-based sampling strategies for signal diagnosis and analysis. This approach was developed in the control-engineering field. In an event-based sampling approach, a specific event trigger - not the time - instructs the sensor to grab a sample of the signal's current state and send the signal to the digital processing system. In this document, the concept of sampling based on events is discussed, and seven event-based strategies are presented. Also, applications of these sampling approaches for phenomena detection in waveforms are given. This experimental study provides new insights for applications that benefit from these event-based sampling techniques.