This session will also include a panel discussion on the research and development needs concerning reliability modeling of digital I&C. Panelists: Hongbin Zhang (INL) Sung-Min Shin (KAERI) Hyun Gook Kang (Rensselaer Polytechnic Institute) Paolo Picca (Office For Nuclear Regulation)

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Papers

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Integrated Risk Assessment of Digital I&C Safety Systems for Nuclear Power Plants

Hongbin Zhang (INL), Han Bao (INL), Tate Shorthill (Univ. of Pittsburgh), Edward Quinn (Technology Resources)

Paper

WGRISK DIGMAP: Comparison of PSA Modeling Approaches for Digital I&C

Markus Porthin (Paul Scherrer Institut), Sung-Min Shin (KAERI), Milan Jaros (ÚJV Řež), Jiri Sedlak (ÚJV Řež), Paolo Picca (Office for Nuclear Regulation), Richard Quatrain (EDF), Jeanne Demgné (EDF), Hans Brinkman (NRG), Venkat Natarajan (NRG), Tero Tyrväinen (VTT Technical Research Centre of Finland), Christian Müller (Gesellschaft fuer Anlagen- und Reaktorsicherheit), Ewgenij Piljugin (Gesellschaft fuer Anlagen- und Reaktorsicherheit)

Paper

Risk Comparison Among Design Options of RPS with Diverse PLC and FPGA Systems

Hyun Gook Kang (Rensselaer Polytechnic Institute), Kwang-Seop Son (KAERI), Seung Hwan Seong (KAERI)

Paper