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Characterization of Pentavalent and Hexavalent Americium in Nitric acid using X-ray Absorption Fine Structure Spectroscopy and First-Principles Modeling

C. L. Riddle (INL), K. Czerwinski, E. Kim (Univ of Nevada, Las Vegas), P. D. Paviet (DOE), P. F. Weck (SNL), F. Poineau (Univ of Nevada, Las Vegas), S. Conradson (LANL)

Transactions / Volume 111 / Number 1 / November 2014 / Pages 434-437

 
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