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Conference Spotlight
Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
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The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Hash Hashemian: Visionary leadership
As Dr. Hashem M. “Hash” Hashemian prepares to step into his term as President of the American Nuclear Society, he is clear that he wants to make the most of this unique moment.
A groundswell in public approval of nuclear is finding a home in growing governmental support that is backed by a tailwind of technological innovation. “Now is a good time to be in nuclear,” Hashemian said, as he explained the criticality of this moment and what he hoped to accomplish as president.
John A. Andersen
Nuclear Technology | Volume 72 | Number 1 | January 1986 | Pages 75-83
Technical Paper | Radioactive Waste Management | doi.org/10.13182/NT86-A33755
Articles are hosted by Taylor and Francis Online.
A method is presented for correlating a tracer gas leakage rate to the potential particulate radioactive material (RAM) release from packages for the shipment of RAM, for those cases where a gas leak measurement is used and there is no measurable particulate release. The correlation method involves a calculational technique relating the measured gas leakage to capillary flow, then to the design and dimensions of the actual seal, and then to the minimum size of the particulate material being contained. Numerous examples are cited. This method is useful both in the evaluation of results obtained during regulatory-required testing, and in the process of applying for package certification or licensing. It is indicated that relatively large measured leaks in containment vessels may be analogous to extremely small defects in the actual seal, and to minute releases of RAM.