ANS is committed to advancing, fostering, and promoting the development and application of nuclear sciences and technologies to benefit society.
Explore the many uses for nuclear science and its impact on energy, the environment, healthcare, food, and more.
Explore membership for yourself or for your organization.
Conference Spotlight
2026 ANS Annual Conference
May 31–June 3, 2026
Denver, CO|Sheraton Denver
Latest Magazine Issues
Jan 2026
Jul 2025
Latest Journal Issues
Nuclear Science and Engineering
February 2026
Nuclear Technology
January 2026
Fusion Science and Technology
November 2025
Latest News
Jeff Place on INPO’s strategy for industry growth
As executive vice president for industry strategy at the Institute of Nuclear Power Operations, Jeff Place leads INPO’s industry-facing work, engaging directly with chief nuclear officers.
Helmut Hoven, Karl Koizlik, Hubertus Nickel
Nuclear Technology | Volume 66 | Number 1 | July 1984 | Pages 127-138
B. Structural Characterization of Microstructure and Matallographical Aspect | Status of Metallic Materials Development for Application in Advanced High-Temperature Gas-Cooled Reactor / Material | doi.org/10.13182/NT84-A33461
Articles are hosted by Taylor and Francis Online.
Heat-resistant metallic materials for use in high-temperature gas-cooled reactors are nickel- or iron-base, solid-solution-strengthened, or age-hardened alloys. To control the material behavior and to adapt it to realistic load conditions, they have to be tested and characterized. During recent years, interference layer metallography has become an independent characterization procedure as well as an outstanding method for sample preparation for the application of quantitative image analysis to these refractory alloys. The special problems of characterization of nickel- and iron-base alloys that can now be solved by interference layer metallography and its physical backround are reported. Chromatic contrasting and the subsequent phase analysis by way of the example of three common alloys are discussed. Finally, the optimization of interference layer metallography for application in quantitative image analysis is described.