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CLEAN SMART bill reintroduced in Senate
Senators Ben Ray Luján (D., N.M.) and Tim Scott (R., S.C.) have reintroduced legislation aimed at leveraging the best available science and technology at U.S. national laboratories to support the cleanup of legacy nuclear waste.
The Combining Laboratory Expertise to Accelerate Novel Solutions for Minimizing Accumulated Radioactive Toxins (CLEAN SMART) Act, introduced on February 11, would authorize up to $58 million annually to develop, demonstrate, and deploy innovative technologies, targeting reduced costs and safer, faster remediation of sites from the Manhattan Project and Cold War.
R. R. Schemmel, L. D. Philipp, J. L. Stringer
Nuclear Technology | Volume 17 | Number 3 | March 1973 | Pages 198-204
Technical Paper | Reactor | doi.org/10.13182/NT73-A31263
Articles are hosted by Taylor and Francis Online.
The mineral insulators, such as Al2O3, MgO, and SiO2, appear to possess satisfactory radiation tolerance and acceptable high temperature electrical properties for many nuclear applications. However, our tests on practical cables for reactor instrumentation systems, and experiments to determine electrical properties of bulk materials, have revealed phenomena which limit applicable temperature ranges and dc voltage bias levels. For example, these materials exhibit a rapid decrease in electrical resistivity and a corresponding increase in law frequency dielectric constant with increasing temperature above some critical temperature. Also, cables employed for dc bias purposes have exhibited a phenomenon, termed breakdown pulse noise, which has been a major obstacle to satisfactory operation of low-level fission counters for the Fast Flux Test Facility since the breakdown-pulse -noise -generated pulses are indistinguishable from typical detector pulses. SiO2- and MgO-insulated cables determined a useful region of operation as a function of insulator compaction density and purity. However, if insufficient care is taken in the preparation and design of cable end seals, the connector region of the cable may cause unsatisfactory performance even though the body of the cable satisfies test criteria.