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My Story: John L. Swanson—ANS member since 1978
. . . and in 2019, on his 90th birthday.
Swanson in 1951, the year of his college graduation . . .
My pre-college years were spent in a rural suburb of Tacoma, Wash. In 1947, I enrolled in Reed College, a small liberal arts school in Portland, Ore.; I majored in chemistry and graduated in 1951. While at Reed, I met and married a young lady with whom I would raise 3 children and spend the next 68 years of my life—almost all of them in Richland, Wash., where I still live.
I was fortunate to have a job each of my “college summers” that provided enough money to cover my college costs for the next year; I don’t think that is possible these days. My job was in the kitchen/dining hall of a salmon cannery in Alaska. Room and board were provided and the cannery was in an isolated location, so I could save almost every dollar of my salary.
Dean Wang
Nuclear Science and Engineering | Volume 193 | Number 12 | December 2019 | Pages 1339-1354
Technical Paper | doi.org/10.1080/00295639.2019.1638660
Articles are hosted by Taylor and Francis Online.
The SN transport equation asymptotically tends to an equivalent diffusion equation in the limit of optically thick systems with small absorption and sources. A spatial discretization of the SN equation is of practical interest if it possesses the optically thick diffusion limit. Such a numerical scheme will yield accurate solutions for diffusive problems if the spatial mesh size is thin with respect to a diffusion length, whereas the mesh cells are thick in terms of a mean free path. Many spatial discretization methods have been developed for the SN transport equation, but only a few of them can obtain the thick diffusion limit under certain conditions. This paper presents a theoretical result that simply states that the mesh size required for a finite difference scheme to attain the diffusion limit is , where is the order of accuracy of spatial discretization, is the “diffusion” mesh size that can be many mean free paths thick, and is a small positive scaling parameter that can be defined as the ratio of a particle mean free path to a characteristic scale length of the system. Numerical results for schemes such as the Diamond Difference method, Step Characteristic method, Step Difference method, Second-Order Upwind method, and Lax-Friedrichs Weighted Essentially Non-Oscillatory method of the third order (LF-WENO3) are presented that demonstrate the validity and accuracy of our analysis.