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2025 ANS Winter Conference & Expo
November 9–12, 2025
Washington, DC|Washington Hilton
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Leading the charge: INL’s role in advancing HALEU production
Idaho National Laboratory is playing a key role in helping the U.S. Department of Energy meet near-term needs by recovering HALEU from federal inventories, providing critical support to help lay the foundation for a future commercial HALEU supply chain. INL also supports coordination of broader DOE efforts, from material recovery at the Savannah River Site in South Carolina to commercial enrichment initiatives.
Steven E. Aumeier, Bulent Alpay, John C. Lee, A. Ziya Akcasu
Nuclear Science and Engineering | Volume 153 | Number 2 | June 2006 | Pages 101-123
Technical Paper | doi.org/10.13182/NSE06-A2599
Articles are hosted by Taylor and Francis Online.
We present probabilistic techniques that make synergistic use of available process information for diagnosis and detection of component fault manifestation in a multicomponent system. We begin by describing the motivation for using probabilistic techniques for systems diagnostics and then define probabilistic expressions that embody the diagnostics knowledge of interest. We show that a combination of a Bayesian expression with the solution to the Chapman-Kolmogoroff equation contains the diagnostic information of interest while explicitly making use of available process information including plant data or measurements, mathematical system models, and individual component reliability data. Given these probabilistic expressions, we introduce a practical means of obtaining the necessary constituent probability density functions corresponding to feasible component transitions via an adaptive Kalman filtering formulation. To demonstrate the consolidated probabilistic technique, we consider a low-order model of a balance of plant of a boiling water reactor, represented by 11 system variables, 9 component characteristics, and 5 observations. We simulate 5 to 10% degradations in two components subject to 1% signal noise in two different transient events. Our test calculations indicate that the proposed algorithm is able to provide correct fault detection and diagnosis of the faulted components and fault magnitudes, together with a rank-ordered likelihood of the binary faults.