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Division Spotlight
Young Members Group
The Young Members Group works to encourage and enable all young professional members to be actively involved in the efforts and endeavors of the Society at all levels (Professional Divisions, ANS Governance, Local Sections, etc.) as they transition from the role of a student to the role of a professional. It sponsors non-technical workshops and meetings that provide professional development and networking opportunities for young professionals, collaborates with other Divisions and Groups in developing technical and non-technical content for topical and national meetings, encourages its members to participate in the activities of the Groups and Divisions that are closely related to their professional interests as well as in their local sections, introduces young members to the rules and governance structure of the Society, and nominates young professionals for awards and leadership opportunities available to members.
Meeting Spotlight
Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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NRC cuts fees by 50 percent for advanced reactor applicants
The Nuclear Regulatory Commission has announced it has amended regulations for the licensing, inspection, special projects, and annual fees it will charge applicants and licensees for fiscal year 2025.
Y. S. Horowitz, M. Moscovitch, J. M. Mack, H. Hsu, E. Kearsley
Nuclear Science and Engineering | Volume 94 | Number 3 | November 1986 | Pages 233-240
Technical Paper | doi.org/10.13182/NSE86-A17266
Articles are hosted by Taylor and Francis Online.
Electron Monte Carlo calculations using CYLTRAN and a new PHSECE (Photon-Produced Secondary Electrons) technique were carried out to estimate electron fluences and energy deposition profiles near LiF/Al and LiF/Pb material interfaces undergoing 60Co gamma irradiation. Several interesting and new features emerge: (a) although the buildup of the secondary electron fluences at the interfaces of the irradiated media is approximately exponential, the value of the electron mass fluence buildup coefficient, γ, is not equal to the electron mass fluence attenuation coefficient, β;(b) the β value of the attenuation of the gamma generated electron fluences at the cavity/medium interfaces is strongly dependent on the Z of the adjacent material; and (c) for LiF/Pb there is a significant “intrusion” energy deposition mode arising from sidescattering in the wall material (lead). These new features of interface dosimetry (at least items a and b) are incorporated into the photon general cavity expressions of Burlin (as modified by Horowitz, Dubi, and Moscovitch) and Kearsley and compared with experimental data.
