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Developing a new regulatory framework for advanced reactors: Update on Part 53
White
The American Nuclear Society’s Risk-informed, Performance-based Principles and Policy Committee (RP3C) on March 29 held another presentation in its monthly Community of Practice (CoP) series. The presenter, Patrick White with the Nuclear Innovation Alliance (NIA), talked about the current status of efforts to develop a new regulatory framework for advanced reactors—known as 10 CFR Part 53 or simply Part 53. White serves as the research director of the NIA, where he leads their research as well as analysis-based stakeholder and policymaker engagement and education. White’s March 29 presentation is publicly available on YouTube and at ANS’s publication platform Nuclear Science and Technology Open Research (NSTOR).
RP3C chair N. Prasad Kadambi opened the CoP with brief introductory remarks about the RP3C before he welcomed White as the session’s presenter.
White covered three main topics: the history of the existing regulatory frameworks for new reactors, progress to date on the development of the Part 53 rule for advanced reactors, and the current status and next steps for the Part 53 rulemaking process.
F. Sandras, C. Hermerel, A. Choux, P. Mérillot, G. Pin, L. Jeannot
Fusion Science and Technology | Volume 55 | Number 4 | May 2009 | Pages 389-398
Technical Paper | Eighteenth Target Fabrication Specialists' Meeting | doi.org/10.13182/FST09-A7416
Articles are hosted by Taylor and Francis Online.
To characterize the shape, the quality, and the roughness of microshells, typically used technologies are scanning electron microscopy, scanning interferometric microscopy, or atomic force microscopy. One of the drawbacks of these techniques is that they are generally slow because of their scanning process. Digital holographic microscopy technology is an innovation that can offer ability adapted to these studies. It captures holograms instead of intensity images, as done by conventional microscopes. The holograms are then digitally interpreted (10 per second) to reconstruct a double image, one for the intensity and another one for the phase. Using a rotation axis, the bump counting for the complete microshell surface is possible with a very high speed. Using an image stitching software, mapping can be done in a few minutes. Wavelets such as "Mexican hat" are used to model the bumps. Each bump can then be characterized on the map by its position, diameter, and height.
