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2020 ANS Virtual Winter Meeting
November 16–19, 2020
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Fusion Science and Technology
U.S. reactor technologies to be featured at IAEA conference
A virtual side event at the 64th General Conference of the International Atomic Energy Agency will spotlight U.S. reactor technologies. The free event, US Reactor Technologies: Flexible Energy Security for Real-World Challenges, will be held this Thursday, September 24, from 9:00 a.m. to 10:30 a.m. (EDT).
The event will highlight the capabilities of small modular reactors and other innovative reactors for addressing countries’ current needs. It will also examine anticipated challenges in the future, as well as underscore the need to act now.
The event is sponsored by the U.S. Department of Energy’s Office of Nuclear Energy. Advanced registration is required.
Max Aker, Marco Röllig
Fusion Science and Technology | Volume 76 | Number 3 | April 2020 | Pages 373-378
Technical Paper | dx.doi.org/10.1080/15361055.2020.1712989
Articles are hosted by Taylor and Francis Online.
Beta-induced X-ray spectrometry (BIXS) is a promising method for activity monitoring of tritiated gas species. BIXS systems measure bremsstrahlung and characteristic X-rays generated by interactions of beta decay electrons with surfaces within the measurement chamber. BIXS and other highly sensitive methods such as ionization counting are limited in accuracy by the tritium memory effect, a preconditioning dependent background signal caused by the sorption of tritium on surfaces. In this work, different surface materials have been investigated aiming at reducing the tritium memory effect while providing a high bremsstrahlung yield. A modular BIXS setup was developed that allows the consecutive investigation of different measurement cells utilizing the same detector while protecting it from contamination during cell exchanges. An uncoated stainless steel cell was compared to cells coated with Au, Ir, Ti-W, Ti-Au-Al, and Ti-Au-Cu layer systems. The sample cells were repeatedly exposed to 1100 Pa of molecular tritium. The development of the resulting memory effect was measured during the evacuation between consecutive exposures. Additionally, the background signal decay was investigated in a long-term measurement after the last exposure. In this presentation, the measurement results of the relative tritium memory effect from various surfaces will be shown. The lowest memory effect was measured for the gold-coated sample cell, reaching a background signal equal to (0.83 ± 0.14)% of the signal during exposure after a total dosage of 21.33 × 104 Pa h.