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Conference Spotlight
Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
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Fusion Science and Technology
July 2025
Latest News
DOE issues new NEPA rule and procedures—and accelerates DOME reactor testing
Meeting a deadline set in President Trump’s May 23 executive order “Reforming Nuclear Reactor Testing at the Department of Energy,” the DOE on June 30 updated information on its National Environmental Policy Act (NEPA) rulemaking and implementation procedures and published on its website an interim final rule that rescinds existing regulations alongside new implementing procedures.
Max Aker, Marco Röllig
Fusion Science and Technology | Volume 76 | Number 3 | April 2020 | Pages 373-378
Technical Paper | doi.org/10.1080/15361055.2020.1712989
Articles are hosted by Taylor and Francis Online.
Beta-induced X-ray spectrometry (BIXS) is a promising method for activity monitoring of tritiated gas species. BIXS systems measure bremsstrahlung and characteristic X-rays generated by interactions of beta decay electrons with surfaces within the measurement chamber. BIXS and other highly sensitive methods such as ionization counting are limited in accuracy by the tritium memory effect, a preconditioning dependent background signal caused by the sorption of tritium on surfaces. In this work, different surface materials have been investigated aiming at reducing the tritium memory effect while providing a high bremsstrahlung yield. A modular BIXS setup was developed that allows the consecutive investigation of different measurement cells utilizing the same detector while protecting it from contamination during cell exchanges. An uncoated stainless steel cell was compared to cells coated with Au, Ir, Ti-W, Ti-Au-Al, and Ti-Au-Cu layer systems. The sample cells were repeatedly exposed to 1100 Pa of molecular tritium. The development of the resulting memory effect was measured during the evacuation between consecutive exposures. Additionally, the background signal decay was investigated in a long-term measurement after the last exposure. In this presentation, the measurement results of the relative tritium memory effect from various surfaces will be shown. The lowest memory effect was measured for the gold-coated sample cell, reaching a background signal equal to (0.83 ± 0.14)% of the signal during exposure after a total dosage of 21.33 × 104 Pa h.