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Fusion Science and Technology
Latest News
Glass strategy: Hanford’s enhanced waste glass program
The mission of the Department of Energy’s Office of River Protection (ORP) is to complete the safe cleanup of waste resulting from decades of nuclear weapons development. One of the most technologically challenging responsibilities is the safe disposition of approximately 56 million gallons of radioactive waste historically stored in 177 tanks at the Hanford Site in Washington state.
ORP has a clear incentive to reduce the overall mission duration and cost. One pathway is to develop and deploy innovative technical solutions that can advance baseline flow sheets toward higher efficiency operations while reducing identified risks without compromising safety. Vitrification is the baseline process that will convert both high-level and low-level radioactive waste at Hanford into a stable glass waste form for long-term storage and disposal.
Although vitrification is a mature technology, there are key areas where technology can further reduce operational risks, advance baseline processes to maximize waste throughput, and provide the underpinning to enhance operational flexibility; all steps in reducing mission duration and cost.
S. E. Lee, Y. Hatano, M. Hara, M. Matsuyama
Fusion Science and Technology | Volume 76 | Number 3 | April 2020 | Pages 327-332
Technical Paper | doi.org/10.1080/15361055.2020.1711855
Articles are hosted by Taylor and Francis Online.
Nondestructive measurement of tritium (T) content in solid materials is important for safe and cost-effective disposal of contaminated wastes, and beta-ray induced X-ray spectrometry (BIXS) has been developed for this purpose. A common way to obtain depth profiles of T in solids using BIXS is to perform simulation of X-ray spectra for assumed depth profiles and find a profile giving the best agreement with observation. A detailed understanding of attenuation of low-energy X-rays (≤18.6 keV) by detector components such as a window material is required for interpretation of measured spectra and simulation. In this study, BIXS spectra of a tungsten reference sample with known T depth profile were measured using two different semiconductor detectors and simulated using the Monte Carlo simulation toolkit Geant4. In the low-energy region (<2 keV), the difference in internal structure resulted in a noticeable difference in the BIXS spectra. The disagreement between the measured and the simulated spectra was also significant at <2 keV. Nevertheless, at >2 keV, the BIXS spectra were insensitive to the internal structure of the detector, and the simulated spectra agreed well with the measured ones. The mechanism underlying the difference in the low-energy region was discussed.