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ANS hosts webinar on criticality safety standards
A diagram depicting the NRC’s regulatory structure for nuclear criticality safety. (Image: Oak Ridge National Laboratory)
The American Nuclear Society’s Risk-informed, Performance-based Principles and Policy Committee (RP3C) held another presentation in its monthly Community of Practice (CoP) series last month. RP3C chair Steven Krahn opened the meeting with brief introductory remarks about the importance of risk-informed, performance based (RIPB) decision-making and the need for new approaches to nuclear design that go beyond conventional and deterministic methods.
A. Chobriat, O. Raphaël, C. Hermerel, E. Busvelle, A. Choux, P. Merillot, L. Reverdy, M. Theobald
Fusion Science and Technology | Volume 73 | Number 2 | March 2018 | Pages 132-138
Technical Paper | doi.org/10.1080/15361055.2017.1374813
Articles are hosted by Taylor and Francis Online.
The Digital Holographic Microscopy (DHM) technology allows fast three-dimensional (3-D) surface image acquisition in order to characterize and quantify defects on microshell outer surface. This device captures holograms and reconstructs a double image, one for the intensity and another for the phase. Depending on the used objective lens (20× or 50×) and the microshell diameter, several hundred or thousand pictures must be taken to cover both hemispheres (1170 pictures for a 2200-µm-diameter capsule). A specific handling system using two rotation axes has been developed to acquire automatically all 3-D hemispherical data without any manipulation.
A new version of the 3-D surface rebuilding (using images stitching) and analyzing software is used to characterize (diameter and height measurement) and to localize individual defects, such as bumps or pits. Using a new version of the dedicated software, the pictures are filtered and stitched together to perform a 3-D surface mapping of the capsule. Postprocessing routines are able to detect defects and to sort them out. Specific tools are also dedicated to the characterization of polishing defects, such as concave or clustered defects.
In addition to this, a study of the DHM metrology capabilities, including a comparison with a calibrated atomic force microscope, has been led.