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A. Ejiri, S. Ohdachi, T. Oikawa, S. Shinohara, H. Toyama, K. Yamagishi, K. Miyamoto
Fusion Science and Technology | Volume 27 | Number 3 | April 1995 | Pages 297-300
Reversed Field Pinch Studies | doi.org/10.13182/FST95-A11947091
Articles are hosted by Taylor and Francis Online.
Statistical property of ion and electron temperatures on various plasma parameters has been investigated in REPUTE-1 reversed field pinch (RFP) plasmas. The scalings laws are expressed in terms of the plasma current, loop voltage and line averaged density. Dependence on other parameters seems to be weak. The operational range of density is wide in REPUTE-1, and it is limited by Hugill number H*~1, which is another expression of Ip/N, where Ip is the plasma current and N is the area density. Obtained scaling laws areTi∝VLoop1.3×nˉe−0.3,Te∝Ip0.8×nˉe−0.2, where ne is the line averaged electron density and VLoop is the loop voltage. The electron temperature has roughly same dependence as other RFP devices. The Ip dependence of ion temperature is not found in REPUTE-1, while some RFP devices demonstrate linear dependence.