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Join ANS on Thursday, January 21, at noon (ET) for a Q&A with an expert panel as they discuss how to communicate about the risk of low-dose radiation. “Talking About Low-dose Radiation Risk” is a free members-only event that serves as a follow-up to the “Risky Business” President’s Session that took place during the ANS Virtual Winter Meeting last November. The session will take a deeper dive into the many questions generated from the thought-provoking discussion.
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H. T. Lee, Y. Ohtsuka, Y. Ueda, K. Sugiyama, E. Markina, N. Yoshida
Fusion Science and Technology | Volume 63 | Number 1 | May 2013 | Pages 233-236
Articles are hosted by Taylor and Francis Online.
The structure and concentration distribution of He, H, and D in the ion implanted zone following simultaneous He-D irradiation in W was characterized. A shift in He bubble size from nanometer to tens of nanometers was observed between 800 K < T < 1000 K. The bubble field was found to extend to depths of 30-40 nm with mean concentrations of 4-5 at.%.. An order of magnitude increase in He trapping was observed at 800 K when the ion energy was increased from 0.3 to 1.0 keV. Depth profiles of the trapped D at 500 K indicatea marked decrease in the trapped amount coinciding with the He bubble layer. Conversely, enrichment in hydrogen concentration was observed. One hydrogen atom was found to trap in ratio with ~6 He atoms. Such preferential trapping of hydrogen appears to be an important process in the reduction of D diffusion into W due to He effects.