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The division's objectives are to promote the advancement of knowledge and understanding of the fundamental physical phenomena characterizing nuclear reactors and other nuclear systems. The division encourages research and disseminates information through meetings and publications. Areas of technical interest include nuclear data, particle interactions and transport, reactor and nuclear systems analysis, methods, design, validation and operating experience and standards. The Wigner Award heads the awards program.
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Fusion Science and Technology
ANS webinar to focus on low-dose radiation risk
Join ANS on Thursday, January 21, at noon (ET) for a Q&A with an expert panel as they discuss how to communicate about the risk of low-dose radiation. “Talking About Low-dose Radiation Risk” is a free members-only event that serves as a follow-up to the “Risky Business” President’s Session that took place during the ANS Virtual Winter Meeting last November. The session will take a deeper dive into the many questions generated from the thought-provoking discussion.
Register now to attend the webinar.
K. Tomlinson, D. G. Schroen
Fusion Science and Technology | Volume 63 | Number 2 | March-April 2013 | Pages 288-295
Technical Paper | Selected papers from 20th Target Fabrication Meeting, May 20-24, 2012, Santa Fe, NM, Guest Editor: Robert C. Cook | dx.doi.org/10.13182/FST13-A16352
Articles are hosted by Taylor and Francis Online.
Preshot characterization of the thickness and form of material samples in targets for dynamic materials properties experiments presents unique challenges. Because of design limitations, the measurement tools currently used introduce increasing error as samples deviate from perfect flatness or thickness uniformity. Contact measurements such as height gages and micrometers, for example, are insensitive to thickness variations occurring over spatial scales smaller than the contact probes. In addition, they measure thickness but not form and often damage samples. Standard confocal microscopes overcome some of these problems but can only measure form on the side of the sample that they see. Also, by design, they consistently overestimate thickness because form errors on the side of the sample against the reference surface always prevent perfect contact with it. We are developing a technique that may prove to be superior to both of these methods at characterizing both thickness and form of samples with both imperfect flatness and nonuniform thickness using only an interferometric optical profiler, an inexpensive fixture, a gage block, and a commercial three-dimensional modeling software. The end result is a computer model of the actual sample.