White light interferometry has been adapted to the characterization of transparent ICF shells and their precursor mandrels. The combination of an interferometric microscope, a precision z-stage, and simulation-derived analysis algorithms allow determination of the diameters of the inner and outer surfaces, their non-concentricity, the location of interfacial layers, the average index of refraction of the walls, and the thickness of discrete layers within the shell wall. The hard- and soft-ware required for these measurements are described.