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Conference Spotlight
2026 Nuclear Energy Conference & Expo (NECX)
August 24–27, 2026
Dallas, TX|Hilton Anatole
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Nuclear Science and Engineering
September 2026
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August 2026
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The human factor in licensing and operating the next generation of nuclear plants
As human factors specialists working at the intersection of human performance and nuclear operations, we are witnessing one of the nuclear sector’s most significant transitions in decades. The emergence of small modular reactors, microreactors, and other advanced designs is reshaping the industry’s landscape. Digital instrumentation and controls, passive safety systems, and increased automation are creating opportunities for greater safety margins and more flexible operation. These same features also fundamentally redefine what it means to “operate” a nuclear plant. Interactions among human roles, automation, and passive systems shape how people maintain awareness, exercise judgment, and intervene when necessary. These developments affect both operational realities and the regulatory foundations on which nuclear safety is built.
14th International Topical Meeting on Nuclear Applications of Accelerators
Technical Session
Wednesday, December 1, 2021|4:20–5:45PM EST |Lincoln West
Session Chair:
Lin Shao
Session Organizer:
Eric J. Pitcher
Student Assistant:
Zach Deziel
To access the session recording, you must be logged in and registered for the meeting.
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To access paper attachments, you must be logged in and registered for the meeting.
Demonstrated Performance of High Current Isotope Production Targetry at LANL
4:25–4:45PM EST
Ellen M. O'Brien (LANL), Christiaan E. Vermeulen (LANL), Eva R. Birnbaum (LANL), Eric R. Olivas (LANL), David A. Reass (LANL)
Paper
Neutronics Impacts of SNS Proton Power Upgrade
4:45–5:05PM EST
F. X. Gallmeier (ORNL), W. Lu (ORNL), I. Remec (ORNL), I. I. Popova (ORNL), K. Bekar (ORNL), B. W. Riemer (ORNL)
Reference
KIPT Target Cooling System Modeling and Analyses by ANSYS FLUENT
5:05–5:25PM EST
A. Talamo (ANL), Z. Zhong (ANL), Y. Gohar (ANL)
The Effect of P+ -Ion Exposure of Ohmic Contacts Mo/Si of Bipolar Transistor on the Grain Size of Mo Films
5:25–5:45PM EST
Yu. Snitovsky (JSC Integral), Ya. Solovyov (JSC Integral)
