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Division Spotlight
Nuclear Criticality Safety
NCSD provides communication among nuclear criticality safety professionals through the development of standards, the evolution of training methods and materials, the presentation of technical data and procedures, and the creation of specialty publications. In these ways, the division furthers the exchange of technical information on nuclear criticality safety with the ultimate goal of promoting the safe handling of fissionable materials outside reactors.
Meeting Spotlight
2025 ANS Annual Conference
June 15–18, 2025
Chicago, IL|Chicago Marriott Downtown
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Nuclear Science and Engineering
July 2025
Nuclear Technology
June 2025
Fusion Science and Technology
Latest News
Nominations open for CNTA awards
Citizens for Nuclear Technology Awareness is accepting nominations for its Fred C. Davison Distinguished Scientist Award and its Nuclear Service Award. Nominations for both awards must be submitted by August 1.
The awards will be presented this fall as part of the CNTA’s annual Edward Teller Lecture event.
14th International Topical Meeting on Nuclear Applications of Accelerators
Technical Session
Wednesday, December 1, 2021|4:20–5:45PM EST |Lincoln West
Session Chair:
Lin Shao
Session Organizer:
Eric J. Pitcher
Student Assistant:
Zach Deziel
To access the session recording, you must be logged in and registered for the meeting.
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Demonstrated Performance of High Current Isotope Production Targetry at LANL
4:25–4:45PM EST
Ellen M. O'Brien (LANL), Christiaan E. Vermeulen (LANL), Eva R. Birnbaum (LANL), Eric R. Olivas (LANL), David A. Reass (LANL)
Paper
Neutronics Impacts of SNS Proton Power Upgrade
4:45–5:05PM EST
F. X. Gallmeier (ORNL), W. Lu (ORNL), I. Remec (ORNL), I. I. Popova (ORNL), K. Bekar (ORNL), B. W. Riemer (ORNL)
Reference
KIPT Target Cooling System Modeling and Analyses by ANSYS FLUENT
5:05–5:25PM EST
A. Talamo (ANL), Z. Zhong (ANL), Y. Gohar (ANL)
The Effect of P+ -Ion Exposure of Ohmic Contacts Mo/Si of Bipolar Transistor on the Grain Size of Mo Films
5:25–5:45PM EST
Yu. Snitovsky (JSC Integral), Ya. Solovyov (JSC Integral)
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