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Division Spotlight
Nuclear Criticality Safety
NCSD provides communication among nuclear criticality safety professionals through the development of standards, the evolution of training methods and materials, the presentation of technical data and procedures, and the creation of specialty publications. In these ways, the division furthers the exchange of technical information on nuclear criticality safety with the ultimate goal of promoting the safe handling of fissionable materials outside reactors.
Meeting Spotlight
2024 ANS Annual Conference
June 16–19, 2024
Las Vegas, NV|Mandalay Bay Resort and Casino
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
Latest Magazine Issues
May 2024
Jan 2024
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Nuclear Science and Engineering
June 2024
Nuclear Technology
Fusion Science and Technology
Latest News
Securing the advanced reactor fleet
Physical protection accounts for a significant portion of a nuclear power plant’s operational costs. As the U.S. moves toward smaller and safer advanced reactors, similar protection strategies could prove cost prohibitive. For tomorrow’s small modular reactors and microreactors, security costs must remain appropriate to the size of the reactor for economical operation.
Technical Session|Fusion and Plasma Physics
Friday, April 5, 2024|1:35–2:55PM EDT|Leonhard Building Room 102
Session Chair:
Matthew Leoschke
Alternate Chair:
Chase C. Hargrove
Session Organizer:
Jonathan B. Balog
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Effects of Temperature and Polarity on Plasma Electrolytic Process for Nitrogen Fixation
1:35–1:55PM EDT
Emily Gillmore (Univ. Illinois, Urbana-Champaign), Brandon Kamiyama (Univ. Illinois, Urbana-Champaign), Mohan Sankaran (Univ. Illinois, Urbana-Champaign)
Paper
Design and Fabrication of a High Aspect Ratio Sensor for Semiconductor Manufacturing Diagnostics
1:55–2:15PM EDT
Alexandra M. Peevy (NCSU), Natalie Coon (NCSU), Nathaniel T. Rogalski (NCSU), Tanjina Akter (NCSU)
Elastic Cross Section of Tin Ions in an Extreme Ultraviolet Lithography Source
2:15–2:35PM EDT
Jack Gerrity (Univ. Illinois, Urbana-Champaign), Nathan Bartlett (Univ. Illinois, Urbana-Champaign), David N. Ruzic (Univ. Illinois, Urbana-Champaign)
Analysis of Fluoroelastomer and Perfluoroelastomer Degradation in Various Plasma Conditions
2:35–2:55PM EDT
Collin W. Jeckell (University of Illinois), Nick Connolly (Univ. Illinois, Urbana-Champaign)
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