Resources

To access session resources, you must be logged in and registered for the meeting.

Register NowLog In

Presentation Slides (Visible to Attendees) — DI-LITE : Edward Chen

Papers

To access paper attachments, you must be logged in and registered for the meeting.

Register NowLog In

Digital Infrastructure Loop Integrated Test Environment for Evaluating Safety-Related Plant Instrumentation and Control System Performance and Reliability

10:00–10:20AM MDT

Edward Chen (INL), Jisuk Kim, Tate Shorthill (INL), Jeffrey C. Joe (INL), Aaron Green, Damian S. Mirizio (Westinghouse Electric Company), Anthony L. Stevens, Stephen Middlekauff

Paper

Low-Cost On-Chip Benchmarking for Reactor-Relevant Radiation Testing of COTS FPGAs

10:20–10:40AM MDT

Wyatt R. Panaccione (Ohio State), Praneeth Kandlakunta (Ohio State), Lei R. Cao (Ohio State)

Paper

Miniaturized soft robotic inspection tool for nuclear components

10:40–11:00AM MDT

Alexander White (University of Connecticut), Anatol Gogoj (University of Connecticut), Mihai Duduta (University of Connecticut)

Paper

Presentation Slides (Visible to Attendees)