Papers

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Digital Infrastructure Loop Integrated Test Environment for Evaluating Safety-Related Plant Instrumentation and Control System Performance and Reliability

10:00–10:20AM MDT

Edward Chen (Idaho National Laboratory), Jisuk Kim, Tate Shorthill (Idaho National Laboratory), Jeffrey C. Joe (Idaho National Laboratory), Aaron Green, Damian S. Mirizio (Westinghouse Electric Company), Anthony L. Stevens, Stephen Middlekauff

Paper

Design, Development, and Testing of a High-Temperature LVDT Sensor for Irradiation Capsules

10:20–10:40AM MDT

Suman Saurav, Ankit Kumar Mishra (Power System Consultant, Iso New England, 1 Sullivan Rd, Holyoke, MA 01040, USA), Sukesh K. Aghara (University of Massachusetts at Lowell)

Paper

Metrology as a Diagnostic Enabler in High-Performance Spherical Tokamaks: Lessons from NSTX-U

10:40–11:00AM MDT

Jeril Philip

Paper

Low-Cost On-Chip Benchmarking for Reactor-Relevant Radiation Testing of COTS FPGAs

11:00–11:20AM MDT

Wyatt R. Panaccione (The Ohio State University), Praneeth Kandlakunta (The Ohio State University), Lei R. Cao (The Ohio State University)

Paper

Miniaturized soft robotic inspection tool for nuclear components

11:20–11:40AM MDT

Alexander White (University of Connecticut), Anatol Gogoj (University of Connecticut), Mihai Duduta (University of Connecticut)

Paper

Discussion

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