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MARVEL team shares lessons learned through microreactor development
On June 1 at the American Nuclear Society’s Annual Conference in Denver, Colo., a team from Idaho National Laboratory presented a session titled “Lessons Learned from MARVEL Reactor Fabrication.” The presentation highlighted challenges that arose as they moved from design to manufacturing and assembly, with a focus on reactor part fabrication, Stirling engine implementation, and reactivity control system development.
DeeEarl Vaden
Nuclear Technology | Volume 88 | Number 3 | December 1989 | Pages 325-331
Technical Paper | Technique | doi.org/10.13182/NT89-A34315
Articles are hosted by Taylor and Francis Online.
The hydrogen meter leak detectors at the Experimental Breeder Reactor II (EBR-II) are periodically checked with a vacuum ionization gauge to see if the leak detectors are calibrated. The gauge, which measures equilibrium pressure, requires an equation to convert the gauge pressure to the hydrogen concentration in sodium. The original equationH, ppm = 10.30 * (Pg, Torr)1/2 is derived from Sievert’s law with adjustments for gauge sensitivity to hydrogen and thermal transpiration effects. EBR-II experience has shown that the Sievert’s law equation has not been reliable in accurately determining the hydrogen concentration in sodium. It is also difficult to determine the hydrogen gauge sensitivity, which can change with time. EBR-II has developed a new equation over a hydrogen range of 0.063 to 0.230 ppm,H, ppm = 0.016 + 10.10 * (Pg, Torr)1/2 , by using a frit-type plugging meter to determine the hydrogen concentration when an equilibrium pressure measurement is done. With sodium hydride as the predominant impurity, the impurity saturation temperature (plugging temperature) measured with the plugging meter can be used to calculate the hydrogen concentration. Measuring the equilibrium gauge pressure and plugging temperature at various hydrogen impurity levels provides the data to accurately calibrate the vacuum ionization gauge without measuring or estimating the gauge sensitivity, gauge temperature, or Sievert’s law constant.