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Conference Spotlight
Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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September 2025
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Latest News
The RAIN scale: A good intention that falls short
Radiation protection specialists agree that clear communication of radiation risks remains a vexing challenge that cannot be solved solely by finding new ways to convey technical information.
Earlier this year, an article in Nuclear News described a new radiation risk communication tool, known as the Radiation Index, or, RAIN (“Let it RAIN: A new approach to radiation communication,” NN, Jan. 2025, p. 36). The authors of the article created the RAIN scale to improve radiation risk communication to the general public who are not well-versed in important aspects of radiation exposures, including radiation dose quantities, units, and values; associated health consequences; and the benefits derived from radiation exposures.
Technical Session|Sponsored by RPD
Thursday, June 11, 2020|12:15–2:00PM EDT
Session Chair:
Jason Hearne (LANL)
Alternate Chair:
Pavel Tsvetkov (LANL)
Session Organizer:
Track Organizer:
Staff Producer:
Jessica Vazquez (American Nuclear Society)
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Minimizing a Class of Azimuthal Power Tilts
James C. Brittingham
Paper
Neutronics Benchmark of CEFR Start-up Tests with SuperMC
Yanting Sun (Chinese Academy of Sciences), Bo Chang (Chinese Academy of Sciences), Bin Li (Chinese Academy of Sciences), Qi Yang (Chinese Academy of Sciences), Bin Wu (Chinese Academy of Sciences)
UUTR Unit Cell Calculations with PENTRAN (SN) and MCNP6 for Activation Foil Validation Studies
Meng-Jen Wang (Univ. of Utah), Glenn E. Sjoden (Univ. of Utah)
Neutronic Consideration of TREAT Facility Fuel SiC Recladding
John D. Bess (INL), Nicolas E. Woolstenhulme (INL)
Monte Carlo Transient Analysis of C5G7-TD Benchmark 3D Problems Using McCARD
Sang Hoon Jang (Seoul Nat'l Univ.), Hyung Jin Shim (Seoul Nat'l Univ.)
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