In situ defect accumulation and radiation hardening in Commercially Pure Titanium and Ti-6Al-4V(wt.%)
A. Amroussia (General Electric Global Research), C. J. Boehlert (Michigan State Univ.), F. Pellemoine (Fermilab), D. Grummon (Michigan State Univ.), W. Mittig (Facility for Rare Isotope Beams, National Superconducting Cyclotron Laboratory), T.R. Bieler (Michigan State Univ.), M. Li , W. Chen (Intermediate Voltage Electron Microscopy—Tandem Facility, Argonne National Laboratory)
Transactions | Volume 123 | Number 1 | November 2020 | Pages 591-592