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CLEAN SMART bill reintroduced in Senate
Senators Ben Ray Luján (D., N.M.) and Tim Scott (R., S.C.) have reintroduced legislation aimed at leveraging the best available science and technology at U.S. national laboratories to support the cleanup of legacy nuclear waste.
The Combining Laboratory Expertise to Accelerate Novel Solutions for Minimizing Accumulated Radioactive Toxins (CLEAN SMART) Act, introduced on February 11, would authorize up to $58 million annually to develop, demonstrate, and deploy innovative technologies, targeting reduced costs and safer, faster remediation of sites from the Manhattan Project and Cold War.
K. N. Prasad, W. A. Jester, F. J. Remick
Nuclear Technology | Volume 24 | Number 2 | November 1974 | Pages 252-259
Technical Paper | Analysis | doi.org/10.13182/NT74-A31481
Articles are hosted by Taylor and Francis Online.
Post-cutting chip activation analysis has been developed for the study of tool wear. In this technique, chips produced during machining are analyzed by neutron activation for a tracer that occurs in the tool. Tungsten was used as a tracer that was inherently present in the tool, and europium was used as a tracer that was added to the tool during its production. It was found that europium fails to effectively meet all the requirements of a tracer in the tool. By using the tungsten in high-speed steel tools and Ti—6Al—4 V alloy work material, it was shown that (a) a random selection of chips was ineffective in providing useful tool wear information and (b) the traditionally ignored break-in period of tool wear could be used to predict tool life to within the same margin of error as conventional methods, but with potential savings in time and cost.