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Division Spotlight
Isotopes & Radiation
Members are devoted to applying nuclear science and engineering technologies involving isotopes, radiation applications, and associated equipment in scientific research, development, and industrial processes. Their interests lie primarily in education, industrial uses, biology, medicine, and health physics. Division committees include Analytical Applications of Isotopes and Radiation, Biology and Medicine, Radiation Applications, Radiation Sources and Detection, and Thermal Power Sources.
Meeting Spotlight
International Conference on Mathematics and Computational Methods Applied to Nuclear Science and Engineering (M&C 2025)
April 27–30, 2025
Denver, CO|The Westin Denver Downtown
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Sam Altman steps down as Oklo board chair
Advanced nuclear company Oklo Inc. has new leadership for its board of directors as billionaire Sam Altman is stepping down from the position he has held since 2015. The move is meant to open new partnership opportunities with OpenAI, where Altman is CEO, and other artificial intelligence companies.
Renato M. Baciarelli
Nuclear Technology | Volume 2 | Number 6 | December 1966 | Pages 471-476
Technical Paper and Note | doi.org/10.13182/NT66-A27539
Articles are hosted by Taylor and Francis Online.
The application of a known technique has been developed for preparing thin films of enriched UO2 to be used in the study of energy deposition efficiency by fission fragment escape from radioactive sources being irradiated. Films have been deposited on stainless-steel sheet by vacuum vapor deposition, using an electron gun to vaporize the UO2. The studies resulted in curves for rate of deposition and uniformity of thickness as well as an experimentally derived formula which relates deposition parameters to uniformity of thickness.