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Conference Spotlight
2026 ANS Annual Conference
May 31–June 3, 2026
Denver, CO|Sheraton Denver
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Christmas Light
’Twas the night before Christmas when all through the house
No electrons were flowing through even my mouse.
All devices were plugged by the chimney with care
With the hope that St. Nikola Tesla would share.
M. A. Schultz, R. D. Guild, J. D. Chipps
Nuclear Technology | Volume 25 | Number 3 | March 1975 | Pages 464-470
Technical Paper | Reactor | doi.org/10.13182/NT75-A24384
Articles are hosted by Taylor and Francis Online.
The use of complex, multiplexed, integrated circuits is proposed for the electronics of nuclear safety shutdown systems. The reliability of such circuit configurations for random failures is favorably compared with paralleled path electronics and is indicated to be extremely high. Advantages in common-mode failure reductions are suggested, and the overall reliability of such circuits without maintenance is indicated to be as high as presentday circuits with maintenance.