This paper investigates single-event transient (SET) effects induced by high-energy particle radiation on the error amplifier (EA) within the loop of a DC-DC (direct current) boost converter using circuit-level simulation methods. Through the analysis of SET propagation within the loop and simulation verification, the relationship between the SET impact on the DC-DC output voltage and load current is derived. A SET mitigation approach based on voltage clamping technology is proposed for SETs occurring at the EA output. By sampling and comparing the EA output voltage, SET detection is achieved. Upon detection of a SET, the EA output voltage is clamped, effectively isolating the SET propagation within the loop and ensuring the stability of the DC-DC output voltage, thereby endowing the DC-DC converter with a certain level of radiation hardness.

The proposed method is verified using a 180-nm commercial BCD (Bipolar, CMOS, DMOS) process. The post-simulation results show that under a high-energy particle linear energy transfer of 100 MeV·cm2/mg, the output voltage variations in the DC-DC converter caused by negative and positive SETs are less than 0.6 mV and 1.7 mV, respectively. The SET mitigation capabilities are 96.1 and 87.1, respectively. Moreover, for the hardened EA, SETs occurring at the output node have a 95.5 probability of not affecting the DC-DC converter’s output voltage.