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Division Spotlight
Reactor Physics
The division's objectives are to promote the advancement of knowledge and understanding of the fundamental physical phenomena characterizing nuclear reactors and other nuclear systems. The division encourages research and disseminates information through meetings and publications. Areas of technical interest include nuclear data, particle interactions and transport, reactor and nuclear systems analysis, methods, design, validation and operating experience and standards. The Wigner Award heads the awards program.
Meeting Spotlight
Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
Standards Program
The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Latest News
NextGen MURR Working Group established in Missouri
The University of Missouri’s Board of Curators has created the NextGen MURR Working Group to serve as a strategic advisory body for the development of the NextGen MURR (University of Missouri Research Reactor).
Keisho Shirakata, Toshihisa Yamamoto, Toshikazu Takeda, Hironobu Unesaki
Nuclear Science and Engineering | Volume 98 | Number 2 | February 1988 | Pages 118-127
Technical Paper | doi.org/10.13182/NSE88-A28491
Articles are hosted by Taylor and Francis Online.
Cell homogenization methods for the neutronics analysis of the blanket region of a plate-type liquid-metal fast breeder reactor critical assembly are investigated, and an improved method is proposed, which calculates cell-averaged cross sections so as to preserve groupwise reaction rates in each cell in a multidrawer cell model. The present homogenization method has been applied to the analysis of the heterogeneous fast critical assembly ZPPR-13. It was found that the keff difference between homogeneous and heterogeneous fast critical assemblies was reduced from 0.4 to 0.2% Δk/k by using the present method.
