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Human Factors, Instrumentation & Controls
Improving task performance, system reliability, system and personnel safety, efficiency, and effectiveness are the division's main objectives. Its major areas of interest include task design, procedures, training, instrument and control layout and placement, stress control, anthropometrics, psychological input, and motivation.
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2024 ANS Annual Conference
June 16–19, 2024
Las Vegas, NV|Mandalay Bay Resort and Casino
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The Standards Committee is responsible for the development and maintenance of voluntary consensus standards that address the design, analysis, and operation of components, systems, and facilities related to the application of nuclear science and technology. Find out What’s New, check out the Standards Store, or Get Involved today!
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Latest News
Proving DRACO will deliver
The United States is now closer than it has been in over five decades to launching the first nuclear thermal rocket into space, thanks to DRACO—the Demonstration Rocket for Agile Cislunar Orbit.
Kevin T. Clarno, Marvin L. Adams
Nuclear Science and Engineering | Volume 149 | Number 2 | February 2005 | Pages 182-196
Technical Paper | doi.org/10.13182/NSE04-31
Articles are hosted by Taylor and Francis Online.
We present recent improvements in assembly-level calculations for reactor analysis, including modifications that support core-level analysis by quasi-diffusion. Our main focus is on accurately approximating the effects that neighboring assemblies have on the few-group cross sections, assembly discontinuity factors, form factors, and other transport parameters of a given assembly. We show that we can do this by using albedo boundary conditions that are estimated with low computational cost. We also present an efficient way to tabulate these effects to permit accurate interpolation by the core-level algorithm. We describe our algorithms and present results from several difficult test problems containing mixed-oxide and UO2 assemblies. Our methodology significantly reduces the largest errors made by present-day methodology. For example, in our test problems it reduces the maximum pin-power error by a factor of ~5.