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Conference Spotlight
Nuclear Energy Conference & Expo (NECX)
September 8–11, 2025
Atlanta, GA|Atlanta Marriott Marquis
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Fusion Science and Technology
August 2025
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The newest era of workforce development at ANS
As most attendees of this year’s ANS Annual Conference left breakfast in the Grand Ballroom of the Chicago Downtown Marriott to sit in on presentations covering everything from career pathways in fusion to recently digitized archival nuclear films, 40 of them made their way to the hotel’s fifth floor to take part in the second offering of Nuclear 101, a newly designed certification course that seeks to give professionals who are in or adjacent to the industry an in-depth understanding of the essentials of nuclear energy and engineering from some of the field’s leading experts.
J. P. Biersack
Fusion Science and Technology | Volume 6 | Number 2 | September 1984 | Pages 475-482
Technical Paper | Selected papers from the Ninth International Vacuum Congress and the Fifth International Conference on Solid Surfaces (Madrid, Spain, September 26-October 1, 1983) | doi.org/10.13182/FST84-A23224
Articles are hosted by Taylor and Francis Online.
Sputtering yields for light ions in the energy range of 0.1–10 keV (particles from fusion plasma) or 40–160 keV under oblique angles (from neutral beam injectors) are difficult to predict by analytic theories. In particular, the sputtering of first wall coatings with low Z compound materials, e.g. TiB2, TiC, cannot be reliably treated in an analytic theory. For these reasons, a large number of cases were studied with the Monte-Carlo code TRIM over the past years. Numerous results were obtained for H, D, T, and He ions incident at various energies and angles on fusion first wall materials (metals and low Z compounds). In addition the sputtering yields as a function of incident energy and angle, and the angular and energy distributions of the sputtered atoms were investigated. Further studies were performed to gain more information on the mechanisms involved: sputtered atoms resulting from incident versus reflected ions, primary knock-on versus secondary knock-on atoms, atoms from the surface versus deeper layers of origin, etc. Experimental data, as far as available, will be compared with the TRIM results.