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North American construction is back—smaller and faster—at OPG’s Darlington
“The nuclear renaissance is real here,” said Ontario Power Generation’s Subo Sinnathamby on May 8, one year to the day after OPG secured a final investment decision to build the first of four planned BWRX-300 reactors at its Darlington nuclear power plant, and shortly after the new reactor’s foundation was lifted into place. “We got our license to construct in April and our [final investment decision] in May, and we’ve been off to the races since.”
Charles A. Gentile, John J. Parker, Stewart J. Zweben
Fusion Science and Technology | Volume 41 | Number 3 | May 2002 | Pages 551-554
Analysis and Monitoring | Proceedings of the Sixth International Conference on Tritium Science and Technology Tsukuba, Japan November 12-16, 2001 | doi.org/10.13182/FST02-A22649
Articles are hosted by Taylor and Francis Online.
Princeton Plasma Physics Laboratory (PPPL) has developed a method of imaging tritium on in-situ surfaces for the purpose of real-time data collection. This method expands upon a previous tritium imaging concept, also developed at PPPL.1 Enhancements include an objective lens coupled to the entry aperture of a coherent fiber optic (CFO) bundle, and a relay lens connecting the exit aperture of the fiber bundle to an intensifier tube and a charge-coupled device (CCD) camera.2 The system has been specifically fabricated for use in determining tritium concentrations on first wall materials. One potential complication associated with the development of D-T fueled fusion reactors is the deposition of tritium (i.e. co-deposited layer) on the surface of the primary wall of the vacuum vessel.3 It would be advantageous to implement a process to accurately determine tritium distribution on these inner surfaces. This fiber optic imaging device provides a highly practical method for determining the location, concentration, and activity of surface tritium deposition. In addition, it can be employed for detection of tritium “hot-spots” and “hide-out” regions present on the surfaces being imaged.