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Chernobyl at 40 years: Looking back at Nuclear News
Sunday, April 26, at 1:23 a.m. local time will mark 40 years since the most severe nuclear accident in history: the meltdown of Unit 4 at the Chernobyl nuclear power plant in Ukraine, then part of the Soviet Union.
In the ensuing four decades, countless books, documentaries, articles, and conference sessions have examined Chernobyl’s history and impact from various angles. There is a similar abundance of outlooks in the archives of Nuclear News, where hundreds of scientists, advocates, critics, and politicians have shared their thoughts on Chernobyl over the years. Today, we will take a look at some highlights from the pages of NN to see how the story of Chernobyl evolved over the decades.
Charles A. Gentile, John J. Parker, Stewart J. Zweben
Fusion Science and Technology | Volume 41 | Number 3 | May 2002 | Pages 551-554
Analysis and Monitoring | Proceedings of the Sixth International Conference on Tritium Science and Technology Tsukuba, Japan November 12-16, 2001 | doi.org/10.13182/FST02-A22649
Articles are hosted by Taylor and Francis Online.
Princeton Plasma Physics Laboratory (PPPL) has developed a method of imaging tritium on in-situ surfaces for the purpose of real-time data collection. This method expands upon a previous tritium imaging concept, also developed at PPPL.1 Enhancements include an objective lens coupled to the entry aperture of a coherent fiber optic (CFO) bundle, and a relay lens connecting the exit aperture of the fiber bundle to an intensifier tube and a charge-coupled device (CCD) camera.2 The system has been specifically fabricated for use in determining tritium concentrations on first wall materials. One potential complication associated with the development of D-T fueled fusion reactors is the deposition of tritium (i.e. co-deposited layer) on the surface of the primary wall of the vacuum vessel.3 It would be advantageous to implement a process to accurately determine tritium distribution on these inner surfaces. This fiber optic imaging device provides a highly practical method for determining the location, concentration, and activity of surface tritium deposition. In addition, it can be employed for detection of tritium “hot-spots” and “hide-out” regions present on the surfaces being imaged.