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The Young Members Group works to encourage and enable all young professional members to be actively involved in the efforts and endeavors of the Society at all levels (Professional Divisions, ANS Governance, Local Sections, etc.) as they transition from the role of a student to the role of a professional. It sponsors non-technical workshops and meetings that provide professional development and networking opportunities for young professionals, collaborates with other Divisions and Groups in developing technical and non-technical content for topical and national meetings, encourages its members to participate in the activities of the Groups and Divisions that are closely related to their professional interests as well as in their local sections, introduces young members to the rules and governance structure of the Society, and nominates young professionals for awards and leadership opportunities available to members.
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Latest News
DOE issues RFQ for clean-energy projects at WIPP
The Department of Energy has issued a request for qualifications (RFQ) for interested parties that are looking to establish carbon pollution–free electricity (CFE) projects at its Waste Isolation Pilot Plant site in New Mexico.
Robert C. Cook
Fusion Science and Technology | Volume 51 | Number 4 | May 2007 | Pages 559-563
Technical Paper | doi.org/10.13182/FST07-A1444
Articles are hosted by Taylor and Francis Online.
In this paper we show that the ambient temperature measured leakage time constant, RT, is related to the leakage at cryogenic temperature, RC, byRC = 0.23DTVsh/RTwhere DT is the density of cryogenic DT vapor, and Vsh is the internal volume of the shell. We then calculate the size of voids that may result from leakage at the Be/DT interface, depending upon the number of leakage sites and RT. Even for the slowest leakers the potential void growth is excessive. Reasons that voids have not been seen in DT layering experiments to date include the lack of a technique to see isolated micronish bubbles, however possible mechanisms preventing void formation are also discussed.