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Attendees will take a tour of the CHARISMA Laboratory and will see a JEOL NeoArm S/TEM (Scanning Transmission Electron Microscope), a Scios DualBeam Focused Ion Beam (FIB)/Scanning Electron Microscope (SEM), an X-ray Computed Tomography (XCT) system, and an X-Ray Diffraction (XRD) system. These instruments are heavily used in the nuclear materials community to view fuels, structural materials, and diagnostics on the nanometer scale and gain information about the impact of the nuclear reactor environment on the material’s structure and properties