Home / Store / Journals / Electronic Articles / Fusion Science and Technology / Volume 49 / Number 4
D. A. Steinman, R. B. Stephens, M. L. Hoppe
Fusion Science and Technology
Volume 49 / Number 4 / May 2006 / Pages 635-637
Format:electronic copy (download)
White light interferometry has been adapted to the characterization of transparent and opaque witness plates for ICF and high energy physics experiments. An interferometric microscope, a precision z-stage, and a technique that minimizes optical dispersion allows determination of witness plate thickness to sub-micron precision. The hardware and methodology required for this measurement are described.
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